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EK10 11 12 SAPPHIRE

Hard contact probe.

A revolutionary piezocomposite crystal technology associated to highly performant and wear resistant hybrid front face allows Sapphire probes to be used directly in contact with the part and endure prolonged exposure to mechanical stress and friction without compromising their accuracy and performance.

  • Features
  • Includes
  • Options
  • Applications
  • Elevation7-10 mm
  • Element count16 ,32 and 64 elements
  • Element pitch0.3 to 0.6 mm
  • Frequency2.5, 3.5 and 10 MHz
  • Cable length2.5 m
  • Certificate of conformity compliant with ISO 18563-2 standard
  • Travel Case
  • IPEX, EAsy-latch, Zpac, Hypertronic Connectors
  • Custom cable length
  • Corrosion mapping
  • Thickness measurement

Description

Technical specifications

Reference Frequency MHz Number of elements Pitch mm Elevation mm
LINEAR PROBES
EK10-LA3.5/16-SAPPHIRE 3.5 16 0.6 10
EK10-LA5/16-SAPPHIRE 5
EK11-LA2.25/32-SAPPHIRE 2.25 32
EK11-LA5/32-SAPPHIRE 5
EK11-LA5/64-SAPPHIRE 5 64 0.35 8
EK12-LA2.25/64-SAPPHIRE 2.25 0.6 10
EK12-LA3.5/64-SAPPHIRE 3.5 0.6 10
EK12-LA5/64-SAPPHIRE 5 0.6 10
MATRIX PROBES
EK11-M5/64-SAPPHIRE 5 64 1.4 2